Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals
Experiments and Simulations
Springer
ISBN 978-3-031-58849-5
Standardpreis
Bibliografische Daten
Fachbuch
Buch. Softcover
2024
32 s/w-Abbildungen, 23 Farbabbildungen, Bibliographien.
In englischer Sprache
Umfang: xix, 115 S.
Format (B x L): 15,5 x 23,5 cm
Verlag: Springer
ISBN: 978-3-031-58849-5
Weiterführende bibliografische Daten
Das Werk ist Teil der Reihe: SpringerBriefs in Materials
Produktbeschreibung
Beyond its relevance to the academic community, this monograph serves as a valuable resource for design and installation organizations, offering insights for specialists involved in the development of modern, new, and energy-efficient innovative materials. The applicability extends to traditional silicon energy and semiconductor electronics, providing practical knowledge for professionals engaged in these fields. Additionally, the work is of significance to a broad spectrum of specialists and managers in various organizations involved in the development of lithium-ion batteries for energy storage systems, especially those employing cutting-edge high-performance materials. As a comprehensive reference in materials science, this monograph caters to a diverse audience engaged in the ongoing advancements and applications within this dynamic field. It is suitable for scientific and engineering professionals, as well as researchers specializing in materials science, physics, semiconductors, photovoltaics, defects engineering, laser technology, solid-state physics, and beam-enhanced synthesis and modification of materials.
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Kundeninformationen
Provides in-depth insights into the unique characteristics of surface defects in LiF, SiO2, and ZnO crystals Appeals to experts in energy-efficient materials impacting traditional semiconductor electronics and Li-ion batteries Suitable for reserachers across diverse fields: semiconductors, photovoltaics, laser technology, and defect engineering
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