Morawiec

Indexing of Crystal Diffraction Patterns

From Crystallography Basics to Methods of Automatic Indexing

Springer

ISBN 978-3-031-11079-5

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Bibliografische Daten

Fachbuch

Buch. Softcover

2023

148 s/w-Abbildungen.

In englischer Sprache

Umfang: xx, 418 S.

Format (B x L): 15,5 x 23,5 cm

Gewicht: 789

Verlag: Springer

ISBN: 978-3-031-11079-5

Produktbeschreibung

This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination. The book is intended equally for materials scientists curious about ‘nuts and bolts’ of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.

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Kundeninformationen

Provides a self-contained account of automatic indexing of crystal diffraction patterns Focuses on a formal description of the indexing problem and methods of automatic indexing Features example algorithms for single crystal indexing, indexing of Laue patterns, and indexing

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