Abbildung von Luo / Chen | Process Monitoring, Fault Diagnosis, and Tolerant Control for Complex Industrial Systems | 1. Auflage | 2025 | beck-shop.de

Ankündigung

Luo / Chen / Li

Process Monitoring, Fault Diagnosis, and Tolerant Control for Complex Industrial Systems

A Festschrift in Honor of Professor Steven X. Ding on the Occasion of His Retirement

Jetzt vorbestellen! Wir liefern bei Erscheinen (Erscheint vsl. September 2025)

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Standardpreis

ca. 53,49 €

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Fachbuch

Buch. Hardcover

2025

xxvi, 740 S. 2 s/w-Abbildungen, 227 Farbabbildungen.

In englischer Sprache

Springer. ISBN 9789819690329

Format (B x L): 15,5 x 23,5 cm

Das Werk ist Teil der Reihe: Lecture Notes in Control and Information Sciences

Produktbeschreibung

This open access book details fault diagnosis, prognosis, and tolerant control for complex industrial systems. It is also dedicated to Professor Steven X. Ding for his retirement. This book proposes data-driven quality-related fault diagnosis schemes based on space projection for linear/nonlinear systems. It also introduces credible and efficient fault prognosis techniques for complex industrial systems. It combines fault detection and re-configuration toward the design of fault-tolerant control methods. It will be a useful reference for students and researchers working on fault diagnosis.