Iniewski / Cai

Deep Learning for Advanced X-ray Detection and Imaging Applications

Springer

ISBN 978-3-031-75652-8

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auch verfügbar als eBook (PDF) für 128,39 €

Bibliografische Daten

Fachbuch

Buch. Hardcover

2025

75 Farbabbildungen.

In englischer Sprache

Umfang: vii, 261 S.

Format (B x L): 15,5 x 23,5 cm

Verlag: Springer

ISBN: 978-3-031-75652-8

Produktbeschreibung

This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications. Readers will discover why AI is set to revolutionize traditional signal processing and image reconstruction with vastly improved performance. The authors illustrate how Machine Learning (ML) and Deep Learning (DL) significantly advance X-ray detection analysis, image reconstruction, and other crucial steps. This book also reveals how these technologies enable photon counting detector-based X-ray Computed Tomography (CT), which has the potential not only to improve current CT images but also enable new clinical applications, such as providing higher spatial resolution, better soft tissue contrast, K-edge imaging, and simultaneous multi-contrast agent imaging. - Explores the latest advances in applying Artificial Intelligence to advanced X-ray imaging; - Provides reviews on innovative techniques for signal formation and image reconstruction process; - Showcases the application of deep learning algorithms in Photon-Counting CT.

Autorinnen und Autoren

Kundeninformationen

Discusses some of the most recent advances in the field of Artificial Intelligence use for advanced X-ray imaging Includes an introduction to novel techniques for Spectral Computed Tomography Demonstrates use of deep learning algorithms and analysis of image reconstruction software for X-ray detection

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