Deep Learning for Advanced X-ray Detection and Imaging Applications
Springer
ISBN 978-3-031-75652-8
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Bibliografische Daten
Fachbuch
Buch. Hardcover
2025
75 Farbabbildungen.
In englischer Sprache
Umfang: vii, 261 S.
Format (B x L): 15,5 x 23,5 cm
Verlag: Springer
ISBN: 978-3-031-75652-8
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Discusses some of the most recent advances in the field of Artificial Intelligence use for advanced X-ray imaging Includes an introduction to novel techniques for Spectral Computed Tomography Demonstrates use of deep learning algorithms and analysis of image reconstruction software for X-ray detection
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