Erschienen: 12.09.2012 Abbildung von Ünlü / Horing | Low Dimensional Semiconductor Structures | 2012 | Characterization, Modeling and...

Ünlü / Horing

Low Dimensional Semiconductor Structures

Characterization, Modeling and Applications

2012. Buch. xiv, 162 S. Bibliographien. Hardcover

Springer. ISBN 978-3-642-28423-6

Format (B x L): 15,5 x 23,5 cm

Gewicht: 432 g

In englischer Sprache

Das Werk ist Teil der Reihe: NanoScience and Technology

Produktbeschreibung

Starting with the first transistor in 1949, the world has experienced a technological revolution which has permeated most aspects of modern life, particularly over the last generation. Yet another such revolution looms up before us with the newly developed capability to control matter on the nanometer scale. A truly extraordinary research effort, by scientists, engineers, technologists of all disciplines, in nations large and small throughout the world, is directed and vigorously pressed to develop a full understanding of the properties of matter at the nanoscale and its possible applications, to bring to fruition the promise of nanostructures to introduce a new generation of electronic and optical devices.
The physics of low dimensional semiconductor structures, including heterostructures, superlattices, quantum wells, wires and dots is reviewed and their modeling is discussed in detail. The truly exceptional material, Graphene, is reviewed; its functionalization and Van der Waals interactions are included here. Recent research on optical studies of quantum dots and on the physical properties of one-dimensional quantum wires is also reported. Chapters on fabrication of nanowire – based nanogap devices by the dielectrophoretic assembly approach. The broad spectrum of research reported here incorporates chapters on nanoengineering and nanophysics. In its presentation of tutorial chapters as well as advanced research on nanostructures, this book is ideally suited to meet the needs of newcomers to the field as well as experienced researchers interested in viewing colleagues’ recent advances.

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