Erschienen: 06.12.2018 Abbildung von Rajaram / Balamurugan | VLSI Design and Test | 1. Auflage | 2019 | 892 | beck-shop.de

Rajaram / Balamurugan / Gracia Nirmala Rani / Singh

VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Buch. Softcover

1st ed. 2019. 2019

xviii, 722 S. 387 s/w-Abbildungen, 324 Farbabbildungen, Bibliographien.

In englischer Sprache

Springer. ISBN 9789811359491

Format (B x L): 15,5 x 23,5 cm

Gewicht: 1100 g

Produktbeschreibung

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

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