Erschienen: 31.08.2004 Abbildung von Poulsen | Three-Dimensional X-Ray Diffraction Microscopy | 2004 | Mapping Polycrystals and their... | 205

Poulsen

Three-Dimensional X-Ray Diffraction Microscopy

Mapping Polycrystals and their Dynamics

lieferbar ca. 10 Tage als Sonderdruck ohne Rückgaberecht

213,99 €

inkl. Mwst.

2004. Buch. xii, 156 S. 7 s/w-Tabelle, Bibliographien. Hardcover

Springer. ISBN 978-3-540-22330-6

Format (B x L): 15,5 x 23,5 cm

Gewicht: 930 g

In englischer Sprache

Das Werk ist Teil der Reihe: Springer Tracts in Modern Physics; 205

Produktbeschreibung

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Autoren

  • Dieses Set enthält folgende Produkte:
      Auch in folgendem Set erhältlich:
      • nach oben

        Ihre Daten werden geladen ...