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Morita / Giessibl / Wiesendanger

Noncontact Atomic Force Microscopy

Volume 2
2012. Buch. xviii, 401 S.: 28 s/w-Abbildungen, 77 Farbabbildungen, 7 s/w-Tabelle, Bibliographien. Softcover
Springer ISBN 978-3-642-26070-4
Format (B x L): 15,5 x 23,5 cm
Gewicht: 640 g
In englischer Sprache
Das Werk ist Teil der Reihe:
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

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Professional/practitioner

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Most advanced state-of-the-art report on scanning probe microscopy Presents the latest developments in STM and AFM Deals with the various classes of materials studied A valuable reference work for researchers as well as a study text for graduate students