Erschienen: 31.10.2011 Abbildung von McNulty / Eyberger / Lai | The 10th International Conference on X-Ray Microscopy | 2013 | 1365

McNulty / Eyberger / Lai

The 10th International Conference on X-Ray Microscopy

lieferbar (3-5 Tage)

181,85 €

inkl. Mwst.

2013. Buch. 486 S. Softcover

AIP Press. ISBN 978-0-7354-0925-5

In englischer Sprache

Produktbeschreibung

This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.

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