Erschienen: 09.10.2014 Abbildung von Dehbashi / Fey | Debug Automation from Pre-Silicon to Post-Silicon | 1. Auflage | 2014 | beck-shop.de

Dehbashi / Fey

Debug Automation from Pre-Silicon to Post-Silicon

Buch. Hardcover

2014

xiv, 171 S. 38 s/w-Abbildungen, 55 Farbabbildungen, 12 s/w-Tabelle, Bibliographien.

In englischer Sprache

Springer. ISBN 978-3-319-09308-6

Format (B x L): 15,5 x 23,5 cm

Gewicht: 450 g

Produktbeschreibung

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. - Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; - Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; - Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

Top-Produkte dieser Kategorie

Autoren

  • Rezensionen

    Dieses Set enthält folgende Produkte:
      Auch in folgendem Set erhältlich:
      • nach oben

        Ihre Daten werden geladen ...