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Bou-Sleiman / Ismail

Built-in-Self-Test and Digital Self-Calibration for RF SoCs

2011. Buch. xvii, 89 S.: 70 s/w-Abbildungen, 7 s/w-Tabelle, Bibliographien. Softcover
Springer ISBN 978-1-4419-9547-6
Format (B x L): 15,5 x 23,5 cm
Gewicht: 177 g
In englischer Sprache
Das Werk ist Teil der Reihe:
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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Applies Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC) to real applications in nanometer wireless radio design Provides on-chip testing capabilities as well as on-the-fly calibration abilities to render mixed-mode designs robust from the outset Reduces significantly high volume test costs of RF and mmWave microchips