Erschienen: 18.09.2013 Abbildung von Benediktovich / Feranchuk / Ulyanenkov | Theoretical Concepts of X-Ray Nanoscale Analysis | 2013 | Theory and Applications | 183

Benediktovich / Feranchuk / Ulyanenkov

Theoretical Concepts of X-Ray Nanoscale Analysis

Theory and Applications

lieferbar ca. 10 Tage als Sonderdruck ohne Rückgaberecht

139,09 €

inkl. Mwst.

auch verfügbar als eBook (PDF) für 117.69 €

2013. Buch. xiii, 318 S. 71 s/w-Abbildungen, 37 Farbabbildungen, Bibliographien. Hardcover

Springer. ISBN 978-3-642-38176-8

Format (B x L): 15,5 x 23,5 cm

Gewicht: 664 g

In englischer Sprache

Das Werk ist Teil der Reihe: Springer Series in Materials Science; 183


This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.


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