Neu Erschienen: 07.09.2021 Abbildung von Ambacher / Meier | Millimeter-Wave Tomographic Imaging of Composite Materials. | 1. Auflage | 2021 | 50 | beck-shop.de

Ambacher / Meier

Millimeter-Wave Tomographic Imaging of Composite Materials.

lieferbar, ca. 10 Tage

58,00 €

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Fachbuch

Buch. Softcover

2021

196 S.

In englischer Sprache

Fraunhofer Verlag. ISBN 978-3-8396-1737-3

Format (B x L): 14,8 x 21 cm

Das Werk ist Teil der Reihe: Science for systems; 50

Produktbeschreibung

To utilize the full potential of modern composite materials, new and innovative inspection methods are required to detect and classify defects, which are critical to the mechanical properties of the components. Ideally, such methods are non-contact, non-destructive, and can be applied during the manufacturing process, as well as during the complete lifespan of the components. Measurement systems based on millimeter waves meet these requirements, however, so far, such technologies are not used in an industrial environment, despite their potential of increasing the quality and efficiency of composite materials. Based on the propagation properties of millimeter waves, interacting with composite materials, the capabilities of such millimeter-wave-based measurement systems are investigated. Various measurement systems, operating at different frequency ranges within the millimeter wave spectrum, are developed to demonstrate the capabilities of such systems. This includes various signal-processing methods to provide an optimized evaluation of the measured signals, enabling high-resolution, non-destructive, and non-contact tomographic measurements with the presented measurement technology.

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