Erschienen: 06.02.2013 Abbildung von Ahmad / Yarmo | Advanced X-Ray Characterization Techniques | 1. Auflage | 2013 | Volume 620 | beck-shop.de

Ahmad / Yarmo / Abdul Aziz / Meor Yusoff / Ismail / Abdullah / Sulaiman / Azhar

Advanced X-Ray Characterization Techniques

Selected, peer reviewed papers from the International Conference on X-Ray and related Technique in Research and Industry (ICXRI 2012), July 3-5, 2012, Pulau Pinang, Malaysia

lieferbar, ca. 10 Tage

Buch. Softcover

2013

550 S

In englischer Sprache

Trans Tech Publications. ISBN 978-3-03785-560-7

Format (B x L): 17 x 24 cm

Gewicht: 1050 g

Das Werk ist Teil der Reihe: Advanced Materials Research; Volume 620

Produktbeschreibung

Volume is indexed by Thomson Reuters CPCI-S (WoS)
X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.

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